An easy non-invasive X-ray diffraction method to determine the composition of Na-pyroxenes from high-density `greenstone' implements

Giustetto, R.; Chiari, G.; Compagnoni, R.

doi:10.1107/S0108767307062691

Acta Crystallographica Section A
Acta Crystallographica
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Figure 4
XRPD pattern of a mixed Na-pyroxenite between 28 and 38° 2θ, the angle interval which contains the three most significant reflections for Na-pyroxenes.

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ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 161-168

https://doi.org/10.1107/S0108767307062691

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