High-resolution study of (002, 113, 11−1) four-beam diffraction in Si

Kohn, V.G.; Kazimirov, A.

doi:10.1107/S0108767312012305

Acta Crystallographica Section A
Acta Crystallographica
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Figure 3
Theoretical and experimental polar (θ) 002 and 113 diffraction profiles. Azimuthal (φ) angles for each curve are shown inside the panels. Solid line – theory, circular markers – 002 experiment, rectangular markers – 113 experiment.

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ISSN: 2053-2733

Volume 68| Part 3| April 2012| Pages 331-336

doi:10.1107/S0108767312012305

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