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Figure 8
A single Si atom embedded in a graphene monolayer. (a), (b), (c) and (d) are images using different HAADF-STEM imaging conditions. Recorded on a Nion UltraStem at 60 kV with a probe size of 1.1 Å. Courtesy W. Zhou, J.-C. Idrobo and O. L. Krivanek.

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ISSN: 2053-2733
Volume 69| Part 1| January 2013| Pages 45-50
https://doi.org/10.1107/S0108767312047587
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