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Figure 2
(a) Sixteen CBED patterns from [110] silicon with varying beam tilts. The 000 (red), 111 (blue) and 220 (yellow) beams are highlighted in each. (b) Digital reconstruction of LACBED patterns from many individual CBED patterns, highlighting the components from the patterns in (a). (c) The on-axis CBED pattern.

ISSN: 2053-2733
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