 | Acta Crystallographica Section A Acta Crystallographica Section A FOUNDATIONS AND ADVANCES |
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![[Figure 5]](mq5015fig5mag.jpg)
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Figure 5
(a), (b) Visualizations of the central part of the reconstructed complex probe fields of data set 1 and data set 2, respectively. (c) Intensity of a horizontal slice through the probe at the sample [dashed white line in (a)]. (d) Intensity of a vertical slice through the probe at the sample [dash-dotted white line in (a)]. Gaussian fits (red lines) yield FWHM values of 673 nm × 564 nm (h × v). (e) Intensity of a horizontal slice through the probe at the sample [dashed white line in (b)]. (f) Intensity of a vertical slice through the probe at the sample [dash-dotted white line in (b)]. Gaussian fits (red lines) yield FWHM values of 580 nm × 566 nm (h × v). (g), (h) Intensity of numerically propagated probe fields as a slice through the optical axis and the horizontal axis [indicated as a dashed white line in (a), (b)] of the focus (at ![[z\,\,\gtrsim\,\,]](teximages/mq5015fi39.gif) 2 mm) of data sets 1 and 2, respectively. Dashed white lines, dashed black lines and dash-dotted white lines indicate the plane of the pinhole, position of the sample and position of the focal plane, respectively. Scale bars denote 0.5 µm in (a) and (b). |
![[Figure 5]](mq5015fig5.jpg)
| FOUNDATIONS ADVANCES |
ISSN: 2053-2733
