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Figure 17
A series of stationary profiles, using the Bragg–Brentano geometry, of the Si sample described in the text. The experiments were measured at 0.5° intervals over 10° in φ. The profiles appear to exist in two distinct forms, a general `background' (smooth hump) and a spiky region superimposed, thought to be associated with `non-Bragg' and `Bragg' contributions, respectively. The spikes appear and disappear within similar angular ranges in φ as predicted from the calculations leading to Fig. 14[link](b).

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ISSN: 2053-2733
Volume 70| Part 3| March 2014| Pages 257-282
doi:10.1107/S205327331400117X
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