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Figure 18
The full profile for Si powder with Cu Kα radiation with (a) and without (b) the instrumental artifacts; (a) and (b) are plotted on square-root and logarithmic scales, respectively. The calculated profile is given by the thick red smooth line, and the six experimental profiles in (a) are overlaid to give some indication of the variations between samples, which is covered in more detail in Fig. 19[link]. The artifacts included are all defined by the instrument dimensions, except the background due to residual scattering (presumably hard radiation from the slits etc.), which is fitted with a polynomial. The spectral dispersion, e.g. Cu Kβ after absorption by the Ni filter, appears at the right level within the background noise. A few reflections are plotted on a linear scale to illustrate the agreement.

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ISSN: 2053-2733
Volume 70| Part 3| March 2014| Pages 257-282
doi:10.1107/S205327331400117X
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