Figure 2
Low-resolution maps of the diffraction intensity on the reflection (417) at (a) E = 4.96 keV and (b) E = 5.007 keV (beam spot ∼ 0.015 × 0.05 mm), measured on the same surface of the sample (configuration `down'). The energy spectra in Fig. 1 have been collected in the monodomain region in the top part of the sample (black dots), while the high-resolution maps in Fig. 3 have been collected in the periodically domain-inverted region (enclosed in black squares). |