|
Figure 3
High-resolution maps on the periodically domain-inverted region at (a) E = 4.96 keV and (b) E = 5.007 keV (beam spot ∼ 1.2 × 1.5 µm achieved with microfocusing), collected on the same surface of the sample. |
|
Figure 3
High-resolution maps on the periodically domain-inverted region at (a) E = 4.96 keV and (b) E = 5.007 keV (beam spot ∼ 1.2 × 1.5 µm achieved with microfocusing), collected on the same surface of the sample. |