view article

Figure 1
Experimental X-ray moiré image, the explanation of which was the starting point of this study. Diffracted-wave image (G image). Taken in a previous synchrotron experiment at PF, KEK, Japan (Yoshimura, 1996aBB42,bBB43), from a monolithic bicrystal specimen with Si 220 reflection and a wavelength of λ = 0.072 nm. The angular width of the incident beam was 0.34′′, and the total thickness of the bicrystal was 3.35 mm (including the gap thickness of 0.225 mm). The long vertical and horizontal lines are the shadows of a platinum line stretched between the specimen and the recording films for the purpose of the experiment. See text for more details.

ISSN: 2053-2733
Follow Acta Cryst. A
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds