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Figure 6
(a) Computer simulation of X-ray diffraction moiré image (rotation moiré of the fringe spacing 0.45 mm) with a silicon bicrystal assumed as the specimen. The 220 reflection with Mo Kα radiation (0.070926 nm) was assumed; plane-wave G image with the deviation angle [\Delta\theta = 0.32'']; zero absorption ([{\chi _{g,i}} = 0]) was assumed. Thicknesses of the component crystals of the bicrystal were t1 = t2 = 0.80 mm, and that of the interspacing gap was tgap = 0.24 mm. The rear component crystal B was assumed to be lightly curved with a curvature of [s = 0.045''] per mm. The scale in the y direction is the same as that in the x direction. See text for more details. (b) Doubly magnified image of the image in (a), to show fringe jumps and discontinuities in detail.

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ISSN: 2053-2733
Volume 71| Part 4| May 2015| Pages 368-381
doi:10.1107/S2053273315004970
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