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Figure 5
Calculated incoherent ADF-STEM image for a single layer of graphene at 60 kV with aberration correction ([C_{S3} = \Delta f =] 0, CS5 = 10 mm, objective aperture of 30 mrad, defocus spread 80 Å, detector angles 60 to 200 mrad, source size 0.5 Å). (a) Ideal, no noise and (b) Poisson electron counting noise (60 pA for 30 µs, yielding a maximum of about 10 to 20 electrons in a pixel). Scale bar is 2 Å.

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ISSN: 2053-2733
Volume 72| Part 1| January 2016| Pages 1-27
doi:10.1107/S205327331501757X
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