Asymmetry in serial femtosecond crystallography data

Sharma, A.; Johansson, L.; Dunevall, E.; Wahlgren, W.; Neutze, R.; Katona, G.

doi:10.1107/S2053273316018696

Acta Crystallographica Section A
Acta Crystallographica
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Figure 2
Percentage of reflections from (a) RC_{vir_XFEL} and (b) RC_{vir_Sync} data that could be best explained using a Gaussian (red) and an ex-Gaussian (blue) distribution.

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ISSN: 2053-2733

Volume 73| Part 2| March 2017| Pages 93-101

https://doi.org/10.1107/S2053273316018696

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