High-resolution X-ray diffraction with no sample preparation

Hansford, G.M.; Turner, S.M.R.; Degryse, P.; Shortland, A.J.

doi:10.1107/S2053273317008592

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 1
Image of a phosphor screen placed at the sample position and illuminated by the incident X-ray beam. The grid interval is 0.5 mm, calibrated by movement of the experimental table.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 73| Part 4| July 2017| Pages 293-311

https://doi.org/10.1107/S2053273317008592

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