High-resolution X-ray diffraction with no sample preparation

Hansford, G.M.; Turner, S.M.R.; Degryse, P.; Shortland, A.J.

doi:10.1107/S2053273317008592

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 4
The EDXRD spectra of the corundum secondary standard recorded with the sample in the normal sample position and shifted away from the source and detector by 16 mm. The difference between the two spectra is shown in black. The difference spectrum has been vertically offset for clarity.

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ISSN: 2053-2733

Volume 73| Part 4| July 2017| Pages 293-311

https://doi.org/10.1107/S2053273317008592

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