High-resolution X-ray diffraction with no sample preparation

Hansford, G.M.; Turner, S.M.R.; Degryse, P.; Shortland, A.J.

doi:10.1107/S2053273317008592

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 5
The measured shifts towards lower energies in the positions of the corundum diffraction peaks due to movement of the sample 16 mm away from the source and detector. The error bars are derived from the errors reported by the peak-fitting routine. The calculated shift is shown as a solid blue line.

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ISSN: 2053-2733

Volume 73| Part 4| July 2017| Pages 293-311

https://doi.org/10.1107/S2053273317008592

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