Small-angle X-ray scattering tensor tomography: model of the three-dimensional reciprocal-space map, reconstruction algorithm and angular sampling requirements

Liebi, M.; Georgiadis, M.; Kohlbrecher, J.; Holler, M.; Raabe, J.; Usov, I.; Menzel, A.; Schneider, P.; Bunk, O.; Guizar-Sicairos, M.

doi:10.1107/S205327331701614X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
(a) Three-dimensional scanning SAXS setup to measure thinly sliced samples. The sample is scanned through the focused beam in x and y at different rotation angles β around y. (b) SAXS tensor tomography setup to measure three-dimensional samples. The sample is scanned through the focused beam in x and y at n orientations which are described by the rotation matrix $[{\bf R}^{\exp}_n(\alpha,\beta)]$ .

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ISSN: 2053-2733

Volume 74| Part 1| January 2018| Pages 12-24

https://doi.org/10.1107/S205327331701614X

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