A method to estimate statistical errors of properties derived from charge-density modelling

Fournier, B.; Guillot, B.; Lecomte, C.; Escudero-Adán, E.C.; Jelsch, C.

doi:10.1107/S2053273318004308

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
Scatter plot of the sample standard deviations (SSDs) versus the estimated standard deviations (e.s.d.) computed with MoPro for interatomic distances between non-H atoms, and angles between three non-H atoms. The first bisector is plotted as the black dashed line.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 74| Part 3| May 2018| Pages 170-183

https://doi.org/10.1107/S2053273318004308

Open

access

Follow Acta Cryst. A

Search IUCr Journals		doi		Advanced search
Author		volume	page