Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range

Nikolaev, K.V.; Makhotkin, I.A.; Yakunin, S.N.; Kruijs, R.W.E.; Chuev, M.A.; Bijkerk, F.

doi:10.1107/S2053273318008963

Acta Crystallographica Section A
Acta Crystallographica
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Figure 4
Simulations of the specular reflection intensity and GID azimuthal rocking curve. Model: Si mono-crystal with various thicknesses of the distorted layer: (a) d = 0 nm, (b) d = 2 nm, (c) d = 5 nm and (d) d = 12 nm. Incident angle $[\theta_0]$ = 0.5°, wavelength λ = 0.154 nm. Single Si crystal, surface orientation (001), scattering crystal planes series {220}, miscut angle ψ = 2°.

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ISSN: 2053-2733

Volume 74| Part 5| September 2018| Pages 545-552

https://doi.org/10.1107/S2053273318008963

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