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Figure 11
High-resolution STEM-BF (a) and STEM-HAADF (b) micrographs showing the two basic kinds of translation defects (S and D) and the elementary module dislocation B. The line noted S shows the simplest translation defects corresponding to the model in Fig. 5[link] made of one unique slab of hexagons with fault vector [{\bf T}_S] = [(0,0,{\overline 1},2,{\overline 1})]. The double line D shows the translation defects generated with two slabs of hexagons [{\bf T}_D] = [2\times (2,{\overline 1},0,0,{\overline 1})]. Finally, the dislocation B can be analysed using a simple generalization of Burgers circuit drawn in (c) leading, as expected, to a Burgers vector [{\bf B}] = [{\bf T}_S] = [(0,0,{\overline 1},2,{\overline 1})]. As shown in (a), the translation defects generate almost no local deformation in contrast to the dislocation B which is surrounded by an observable displacement field generating the dark shadow extending for a few atomic distances.

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ISSN: 2053-2733
Volume 74| Part 6| November 2018| Pages 647-658
https://doi.org/10.1107/S2053273318011439
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