view article
Figure 9
HAADF-STEM image of a W/Si multilayer. Each density fluctuation is manually marked with four dots for the statistical analysis.

Journal logoFOUNDATIONS
ADVANCES
ISSN: 2053-2733
Volume 75| Part 2| March 2019| Pages 342-351
https://doi.org/10.1107/S2053273318017382
Follow Acta Cryst. A
Sign up for e-alerts
E-alerts
Follow Acta Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS