Resolving 500 nm axial separation by multi-slice X-ray ptychography

Huang, X.; Yan, H.; He, Y.; Ge, M.; Öztürk, H.; Fang, Y.-L.L.; Ha, S.; Lin, M.; Lu, M.; Nazaretski, E.; Robinson, I.K.; Chu, Y.S.

doi:10.1107/S2053273318017229

Acta Crystallographica Section A
Acta Crystallographica
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Figure 5
The error-function fittings to the edge profiles of the reconstructed phase images estimate 8.7 and 15.0 nm resolutions on (a) the front and (b) rear surfaces, respectively.

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ISSN: 2053-2733

Volume 75| Part 2| March 2019| Pages 336-341

https://doi.org/10.1107/S2053273318017229

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