Experimentally obtained and computer-simulated X-ray asymmetric eight-beam pinhole topographs for a silicon crystal

Okitsu, K.; Imai, Y.; Yoda, Y.; Ueji, Y.

doi:10.1107/S2053273319001499

Acta Crystallographica Section A
Acta Crystallographica
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Figure 2
Reproduction of Fig. 7 in Okitsu et al. (2006

), showing the six-beam pinhole topographs. An identical floating zone silicon crystal with a thickness of 9.6 mm was also used in the present experiment. However, the angles of the goniometers were adjusted such that the 000 forward-diffracted (FD) and 004, 026, 066, 084, 080, $[0 6 \overline{2}]$ and $[0 2 \overline{2}]$ transmitted-reflected (TR) X-rays were simultaneously strong, as shown in Fig. 1

(a).

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ISSN: 2053-2733

Volume 75| Part 3| May 2019| Pages 474-482

https://doi.org/10.1107/S2053273319001499

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