Experimentally obtained and computer-simulated X-ray asymmetric eight-beam pinhole topographs for a silicon crystal

Okitsu, K.; Imai, Y.; Yoda, Y.; Ueji, Y.

doi:10.1107/S2053273319001499

Acta Crystallographica Section A
Acta Crystallographica
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Figure 5
[S_x(T-T)], [E_x] and [S_x(E-L)] (x ∈ {h, v}) are the T-T simulated, experimentally obtained and E-L&FFT simulated eight-beam pinhole topographs for horizontally (x = h) and vertically (x = v) polarized incident X-rays.

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ISSN: 2053-2733

Volume 75| Part 3| May 2019| Pages 474-482

https://doi.org/10.1107/S2053273319001499

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