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Figure 1
Computer-simulated integrated moiré images of X-ray diffraction for a silicon bicrystal specimen with component-crystal thicknesses of t1 = t2 = 0.8 mm and gap width of tgap = 0. The 220 reflection with Mo Kα1 radiation was assumed. Angular widths of the incident X-rays were set to be [\Delta\Theta_{\rm inc}] = 0.04′′, 0.50′′ and 10.0′′ for images (a), (b) and (c), respectively. The mid deviation angle was set to be [\Delta\theta_{\rm m}] = 0.32′′. The graduations at the bottom of the image (c) are given in mm. For further information see text.

ISSN: 2053-2733
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