Theoretical study of the properties of X-ray diffraction moiré fringes. II. Illustration of angularly integrated moiré images

Yoshimura, J.

doi:10.1107/S2053273319004601

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
Computer-simulated integrated moiré images of X-ray diffraction for a silicon bicrystal specimen with component-crystal thicknesses of t₁ = t₂ = 0.8 mm and gap width of t_gap = 0. The 220 reflection with Mo Kα₁ radiation was assumed. Angular widths of the incident X-rays were set to be $[\Delta\Theta_{\rm inc}]$ = 0.04′′, 0.50′′ and 10.0′′ for images (a), (b) and (c), respectively. The mid deviation angle was set to be $[\Delta\theta_{\rm m}]$ = 0.32′′. The graduations at the bottom of the image (c) are given in mm. For further information see text.

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ISSN: 2053-2733

Volume 75| Part 4| July 2019| Pages 610-623

https://doi.org/10.1107/S2053273319004601

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