Figure 2
|Fth(h)| − |Fmodel(h)| versus resolution [sin θ/λ (Å−1), d (Å)] for the IAM and TAAM models applied to the target crystal structure: (top) electron |F(h)| (Å), (bottom) X-ray |F(h)| (e). |F(h)| were computed using the target atomic positions and thermal parameters (dynamic) or with target atomic positions only (static). |