 | Acta Crystallographica Section A Acta Crystallographica Section A FOUNDATIONS AND ADVANCES |
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![[Figure 2]](ae5081fig2mag.jpg)
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Figure 2
A comparison of two projections used to display diffracted intensity from a cubic diamond sample, with an incident wavelength of 1 nm. The leftmost diagram shows the scattering vectors in reciprocal space along with the viewing plane C–C in real space. The incoming beam lies on the x axis. The axis of symmetry is the z axis. (a) The diffraction pattern as projected onto a planar surface perpendicular to the incident beam, as a function of position on the surface (yfilm, zfilm) in arbitrary units. The scattering at Q is shown at point A. (b) Spherical projection, where the collection of scattered signal on a sphere is viewed in projection along the x axis. The scattering at Q is shown at point B. The projected pattern is displayed as a function of Qy and Qz, in units of m-1. More detail is visible here, as the pattern is compressed at its edges rather than stretched as in (a). |
![[Figure 2]](ae5081fig2.jpg)
| FOUNDATIONS ADVANCES |
ISSN: 2053-2733
