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Figure 1
(a) General view of the experiment setup. Si 220 (s), specimen; [{\bf{g}}], diffraction vector; Ko and Kg, wavevectors of transmitted and of diffracted waves, respectively; the incident beam is σ-polarized (horizontally polarized). P, thin platinum wire stretched in a rigid frame; F, X-ray films, set perpendicularly to the Ko beam; L(+) and L(-), pulling weight for causing a forced rotation of the rear component crystal. The dashed line HL indicates the horizontal direction. The y axis is directed to a horizontal direction, the x axis is parallel to the diffraction vector [{\bf{g}}], and the z axis is perpendicular to the crystal surfaces. The (x,y) coordinate system is the same in the incidence surface of the front component crystal and in the exit surface of the rear component crystal; its origin is placed at the cross-marked position near the -x-side edges of the component crystals, as shown in (b); the origin of the z coordinate is placed on the exit surface of the rear crystal. (b) Detailed drawing of the specimen bicrystal. Dimensions are given in mm. Circular curves [\theta] and [\omega] about the y axis illustrate, respectively, the diffraction angle (incident glancing angle to the diffracting lattice plane) and the [\omega] rotation [[\Delta {\omega _{1,2}}], [\Delta {\omega _{1o,2o}}]; see equations (4a)[link] and (4b)[link] in the text] of the component crystals; circular curve [\rho] about the z axis illustrates the [\rho] rotation ([\Delta \rho], [\Delta {\rho _m}] etc.; see Sections 2.1.3[link], 2.2.1[link] etc.) of the component crystals. In every circular curve the arrow indicates the positive direction of the rotation.

ISSN: 2053-2733
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