Electron image contrast analysis of mosaicity in rutile nanocrystals using direct electron detection

Yoon, A.; Shao, Y.-T.; Howe, J.; Zuo, J.-M.

doi:10.1107/S2053273320011055

Acta Crystallographica Section A
Acta Crystallographica
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Figure 3
Examples of the thickness–defocus map (a) and the tilt map (b) constructed from the simulated images. The parameters for (a) are Tx = 0, Ty = 10 px (1 px = 1.5 mrad) and for (b) Th = 26 nm and Δf = 0. The actual map used for the cross-correlation analysis is larger than the examples shown here.

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ISSN: 2053-2733

Volume 76| Part 6| November 2020| Pages 687-697

https://doi.org/10.1107/S2053273320011055

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