Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law

Kaganer, V.M.; Konovalov, O.V.; Fernández-Garrido, S.

doi:10.1107/S205327332001548X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
(Left) Bird's-eye-view and (right) top-view scanning electron micrographs of (a), (b) sample 1, (c), (d) sample 2 and (e), (f) sample 3. The average NW lengths are 230, 650 and 985 nm, respectively. The scale bar in panel (a) is applicable to all the micrographs.

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ISSN: 2053-2733

Volume 77| Part 1| January 2021| Pages 42-53

https://doi.org/10.1107/S205327332001548X

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