Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law

Kaganer, V.M.; Konovalov, O.V.; Fernández-Garrido, S.

doi:10.1107/S205327332001548X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 11
Distributions of the NW radii and circularities of samples 1–3 obtained from analysis of the top-view scanning electron micrographs (histograms) and the Monte Carlo modelling (lines).

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ISSN: 2053-2733

Volume 77| Part 1| January 2021| Pages 42-53

https://doi.org/10.1107/S205327332001548X

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