Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law

Kaganer, V.M.; Konovalov, O.V.; Fernández-Garrido, S.

doi:10.1107/S205327332001548X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 8
Monte Carlo calculation of the small-angle scattering intensity from an ensemble of NWs with a 5° wide range of orientations of the long axes and random orientation of the side facets. The width of the side facets is 12 nm and the NW lengths vary from 100 to 1000 nm.

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ISSN: 2053-2733

Volume 77| Part 1| January 2021| Pages 42-53

https://doi.org/10.1107/S205327332001548X

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