Simulating dark-field X-ray microscopy images with wavefront propagation techniques

Carlsen, M.; Detlefs, C.; Yildirim, C.; Ræder, T.; Simons, H.

doi:10.1107/S205327332200866X

Acta Crystallographica Section A
Acta Crystallographica
Section AFOUNDATIONS AND ADVANCES

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

disable zoom view article reuse permissions

Figure 9
(a) Monochromatic and (b) polychromatic simulation using an aberrated objective lens. (c) Monochromatic and (d) polychromatic simulation using an aberrated condenser lens. The scale bar refers to distances on the detector.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 78| Part 6| November 2022| Pages 482-490

https://doi.org/10.1107/S205327332200866X

Open

access

Follow Acta Cryst. A

Search IUCr Journals		doi		Advanced search
Author		volume	page