Automated selection of nanoparticle models for small-angle X-ray scattering data analysis using machine learning

Monge, N.; Deschamps, A.; Amini, M.-R.

doi:10.1107/S2053273324000950

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 6
Details of predictions for each sample in DS $[{}_{\rm xeuss}^{\rm real}]$ and DS $[{}_{\rm nano}^{\rm real}]$ when the model is on DS $[{}_{\rm xeuss}^{\rm syn}]$ , DS $[{}_{\rm nano}^{\rm syn}]$ and DS $[{}_{\rm full}^{\rm syn}]$ . Values correspond to the frequency with which a sample is classified as a given form factor over the 20 training sessions.

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ISSN: 2053-2733

Volume 80| Part 2| March 2024| Pages 202-212

https://doi.org/10.1107/S2053273324000950

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