Modelling dynamical 3D electron diffraction intensities. II. The role of inelastic scattering

Mendis, B.

doi:10.1107/S2053273323010690

Acta Crystallographica Section A
Acta Crystallographica
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Figure 3
(a) Simulated thermal diffuse scattering in [110]-Si due to single phonon excitation. (b) The thermal diffuse scattered intensity superimposed on the elastic Bragg scattering. The figure is displayed using a square root intensity scale to highlight weak features in the diffraction pattern. (c) Simulated single plasmon diffuse scattering in [110]-Si. (d) The data from panel (c) displayed using a square root intensity scale to highlight weak features in the diffraction pattern.

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ISSN: 2053-2733

Volume 80| Part 2| March 2024| Pages 178-188

https://doi.org/10.1107/S2053273323010690

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