Influence of device configuration and noise on a machine learning predictor for the selection of nanoparticle small-angle X-ray scattering models

Monge, N.; Amini, M.-R.; Deschamps, A.

doi:10.1107/S2053273324007988

Acta Crystallographica Section A
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Figure 1
Mean accuracy of the predictor over training sessions for each test data set in the different training scenarios. Uncertainty corresponds to 3σ, with σ the standard deviation of the accuracy over training sessions. The x axis corresponds to the sample-to-detector distance of the test data set configuration.

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ISSN: 2053-2733

Volume 80| Part 6| November 2024| Pages 405-413

https://doi.org/10.1107/S2053273324007988

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