Influence of device configuration and noise on a machine learning predictor for the selection of nanoparticle small-angle X-ray scattering models

Monge, N.; Amini, M.-R.; Deschamps, A.

doi:10.1107/S2053273324007988

Acta Crystallographica Section A
Acta Crystallographica
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Figure 4
The graph represents the F1-score per model against the SNR of the tested data, obtained using the predictor trained on the all-times data set.

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ISSN: 2053-2733

Volume 80| Part 6| November 2024| Pages 405-413

https://doi.org/10.1107/S2053273324007988

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