 | Acta Crystallographica Section A Acta Crystallographica Section A FOUNDATIONS AND ADVANCES |
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![[Figure 2]](tw5012fig2mag.jpg)
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Figure 2
Physical optics Bloch wave simulated electron diffraction patterns for a 15 mrad semi-convergence angle, aberration-free STEM probe positioned (a) on an atom column and (b) off an atom column in a 500 Å-thick Si [001] specimen. The two STEM probe positions are indicated by the crosses labelled `A' and `B' in Fig. 3 ![[link]](../../../../../../logos/arrows/a_arr.gif){kind=small} (a). The corresponding results from a multislice simulation are shown in (c) and (d), respectively. All diffraction patterns are displayed on a square root intensity scale to highlight weak features. |
![[Figure 2]](tw5012fig2.jpg)
| FOUNDATIONS ADVANCES |
ISSN: 2053-2733
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