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Figure 3
(a) Schematic of a single silicon unit cell in [001] projection. Open circles denote end-on atom columns. The crosses labelled `A' and `B' are STEM probe positions simulated in Fig. 2[link]. Physical optics Bloch wave simulated 4D STEM images for (b) bright-field (BF), (c) annular bright-field (ABF) and (d) medium-angle annular dark-field (MAADF) imaging modes. The collection angles are 0–5 mrad for BF, 10–15 mrad for ABF and 30–50 mrad for MAADF. The aberration-free STEM probe semi-convergence angle was 15 mrad. The specimen is 500 Å-thick silicon, and the field of view spans a single unit cell in [001] projection.

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ISSN: 2053-2733
Volume 81| Part 2| March 2025|
https://doi.org/10.1107/S2053273325000142
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