Refuting `a new theory for X-ray diffraction' – a reciprocal-space approach

Vlieg, E.; Tinnemans, P.; de Gelder, R.

doi:10.1107/S2053273325000762

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 2
The scattering geometry for computing the path length difference between point P on the top plane and a point x on the lower plane. O is the origin on the lower plane. This is an adaptation of Fig. 4(d) from F14.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 81| Part 4| July 2025| Pages 306-316

https://doi.org/10.1107/S2053273325000762

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