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Figure 8
The scattering patterns for the (a), (b) quenched (Q) sample in-house and (c), (d) quenched sample from the synchrotron, (e), (f) slowly cooled (SC) sample in-house, and (g), (h) slowly cooled sample from the synchrotron. The scattering patterns are shown in the qy = 0 Å−1 plane, corresponding to the h0l plane (left column), and the plane perpendicular to [{\bf a}^*]–[{\bf b}^*], corresponding to the hhl plane (right column). The increased background on the synchrotron measurements is due to the lack of fluorescence suppression on these measurements. The intensity in each row is on an arbitrary scale. A discussion on the effect of the difference in resolution can be found in the supporting information.

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ISSN: 2053-2733
Volume 81| Part 4| July 2025| Pages 254-268
https://doi.org/10.1107/S2053273325003389
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