X-ray dynamical diffraction wavefront division interferometer (double-slit diffraction) with an asymmetric monochromator. Corrigendum

Mkrtchyan, V.; Balyan, M.; Petrosyan, S.; Aivazyan, A.

doi:10.1107/S2053273326002287

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
Intensity distribution in a Si(440) Mo Kα reflection wavefront division interferometer using a Si(440) asymmetrical reflection monochromator, b = 0.026. (a) Interference fringes for the central point source with $[{\xi _s} = 0]$ and $[\Delta \lambda = 0]$ . (b) Intensity distribution for an extended incoherent and non-monochromatic source. Interference fringes are observed.

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ISSN: 2053-2733

Volume 82| Part 3| May 2026| Page 228

https://doi.org/10.1107/S2053273326002287

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