MIDAS: a quantitative framework for high-energy diffraction microscopy. Part II: accuracy, robustness and best practices

Sharma, H.; Park, J.-S.; Shastri, S.; Kenesei, P.

doi:10.1107/S2053273326004018

Acta Crystallographica Section A
Acta Crystallographica
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Figure 12
NF_HEDM: evolution of confidence along the black horizontal line in Fig. 10

(a) for the different grains (blue, orange, green and red lines) and overall (purple line). The overall confidence (purple line) is vertically displaced by 0.05 for illustrative purposes.

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ISSN: 2053-2733

Volume 82| Part 4| July 2026|

https://doi.org/10.1107/S2053273326004018

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