MIDAS: a quantitative framework for high-energy diffraction microscopy. Part II: accuracy, robustness and best practices

Sharma, H.; Park, J.-S.; Shastri, S.; Kenesei, P.

doi:10.1107/S2053273326004018

Acta Crystallographica Section A
Acta Crystallographica
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Figure 15
NF_HEDM: plot of misorientation angles between (a) 0.5° and reference reconstructions, (b) 1° and reference reconstructions, and (c) 0.5° and 1° reconstructions. The 0.5° and 1° reconstructions used generated data by summing every two and four diffraction images. For more details, readers are directed to the text.

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ISSN: 2053-2733

Volume 82| Part 4| July 2026|

https://doi.org/10.1107/S2053273326004018

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