Origin and application of the Lorentz factor in X-ray diffraction

Gasser, F.; Simbrunner, J.; Freychet, G.; Demitri, N.; Holý, V.; Resel, R.

doi:10.1107/S2053273326005917

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
Reciprocal-space representation of different single-crystal X-ray diffraction methods required for the derivation of the respective Lorentz factor. (a) For the rotating single crystal, the reciprocal-lattice points are rotated with an angular velocity $[{\boldomega }]$ through the fixed Ewald sphere defined by the wavevector of the incident beam $[{{\bf{k}}_{\rm{i}}}]$ , with the detector covering the reciprocal area element $[{k^2}{\rm d}{{\Omega}}]$ around the wavevector of the diffracted beam $[{{\bf{k}}_{\rm{f}}}]$ . (b) In the Laue method, polychromatic radiation is used, so that a change of the scattering vector $[{\rm d}{\bf{q}}]$ related to a change of the length of the wavevector k needs to be taken into account.

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ISSN: 2053-2733

Volume 82| Part 5| September 2026|

https://doi.org/10.1107/S2053273326005917

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