Origin and application of the Lorentz factor in X-ray diffraction

Gasser, F.; Simbrunner, J.; Freychet, G.; Demitri, N.; Holý, V.; Resel, R.

doi:10.1107/S2053273326005917

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 3
Scattering geometry of a grazing-incidence X-ray diffraction experiment. The incident wavevector $[{{\bf{k}}_{\rm{i}}}]$ illuminates the sample at an incidence angle $[{\alpha _{\rm{i}}}]$ , and the direction of the diffracted wavevector $[{{\bf{k}}_{\rm{f}}}]$ is defined by an in-plane angle $[{\theta _{\rm{f}}}]$ and an out-of-plane angle $[{\alpha _{\rm{f}}}]$ . Typically, for surface X-ray diffraction measurements a sample rotation with angular velocity $[\omega]$ around the surface normal is performed.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 82| Part 5| September 2026|

https://doi.org/10.1107/S2053273326005917

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