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Figure 2
Powder diffraction pattern of ZrW2O8 collected in 5 min on HRPD. Observed data (+) are shown along with the pattern (solid line) calculated from Rietveld analysis and difference/s.u. (lower trace). The peak at ca 100 000 µs is due to the cryofurnace.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 55| Part 3| June 1999| Pages 333-340
https://doi.org/10.1107/S0108768198016966
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