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Figure 4
Final observed (black circles), calculated (solid line) and difference (below) X-ray powder diffraction profile for the final Rietveld refinement of (I). Reflection positions are also marked.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 58| Part 5| September 2002| Pages 823-834
doi:10.1107/S0108768102011928
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