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Figure 1
Optical micrograph of the measured crystal of sample #1 under crossed polarizers. Face indices refer to the hexagonal cell setting. X′, Y′, Z′ are the projections of the strain reference axis into the 011 plane.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 65| Part 3| June 2009| Pages 334-341
doi:10.1107/S0108768109013901
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