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Figure 5
Diffraction pattern of (1) at ambient conditions. The observed pattern (circles), the best Rietveld fit profile (line) and the difference curve between the observed and the calculated profiles (below) are shown. The high angle part starting at 50° in 2θ is enlarged for clarity.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 77| Part 6| December 2021| Pages 986-995
https://doi.org/10.1107/S2052520621010088
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